Yongmo Zhuo: search on Z-Library

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1

Computer-aided aberration compensation in optical system assembly

Tian, Chao, Yang, Yongying, Zhuo, Yongmo

Journal:

Optik - International Journal for Light and Electron Optics

Year:

2013

Language:

english

File:

PDF, 1.31 MB

english, 2013

2

Point diffraction interferometer with adjustable fringe contrast for testing spherical surfaces

Wang, Daodang, Yang, Yongying, Chen, Chen, Zhuo, Yongmo

Journal:

Year:

2011

Language:

english

File:

PDF, 836 KB

english, 2011

3

Nonnull interferometer simulation for aspheric testing based on ray tracing

Tian, Chao, Yang, Yongying, Wei, Tao, Zhuo, Yongmo

Journal:

Year:

2011

Language:

english

File:

PDF, 740 KB

english, 2011

4

Demodulation of a single-image interferogram using a Zernike-polynomial-based phase-fitting technique with a differential evolution algorithm

Tian, Chao, Yang, Yongying, Wei, Tao, Ling, Tong, Zhuo, Yongmo

Journal:

Year:

2011

Language:

english

File:

PDF, 399 KB

english, 2011

5

Calibration of geometrical systematic error in high-precision spherical surface measurement

Daodang Wang, Yongying Yang, Chen Chen, Yongmo Zhuo

Journal:

Optics Communications

Year:

2011

Language:

english

File:

PDF, 1.49 MB

english, 2011

6

Demodulation of a single complex fringe interferogram with a path-independent regularized phase-tracking technique

Tian, Chao, Yang, Yongying, Liu, Dong, Luo, Yongjie, Zhuo, Yongmo

Journal:

Year:

2010

Language:

english

File:

PDF, 1.64 MB

english, 2010

7

Regularized frequency-stabilizing method for single closed-fringe interferogram demodulation

Tian, Chao, Yang, Yongying, Zhang, Shuna, Liu, Dong, Luo, Yongjie, Zhuo, Yongmo

Journal:

Year:

2010

Language:

english

File:

PDF, 377 KB

english, 2010

8

Polynomial approximation method for tomographic reconstruction of three-dimensional refractive index fields with limited data

Chao Tian, Yongying Yang, Yongmo Zhuo, Tong Ling, Haoran Li

Journal:

Optics and Lasers in Engineering

Year:

2012

Language:

english

File:

PDF, 548 KB

english, 2012

9

SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Polarization point-diffraction interferometer for high-precision testing of spherical surface

Wang, Daodang, Zhang, Yudong, Sasián, José, Yang, Yongying, Chen, Chen, Xiang, Libin, Zhuo, Yongmo, To, Sandy

Year:

2010

Language:

english

File:

PDF, 413 KB

english, 2010

10

Generalized data reduction approach for aspheric testing in a non-null interferometer

Tian, Chao, Yang, Yongying, Zhuo, Yongmo

Journal:

Year:

2012

Language:

english

File:

PDF, 921 KB

english, 2012

11

Tomographic reconstruction of three-dimensional refractive index fields by use of a regularized phase-tracking technique and a polynomial approximation method

Tian, Chao, Yang, Yongying, Zhuo, Yongmo, Wei, Tao, Ling, Tong

Journal:

Year:

2011

Language:

english

File:

PDF, 1.16 MB

english, 2011

12

Modified polarization point diffraction interferometer with extended measurable NA for spherical surface testing

Wang, Daodang, Wang, Fumin, Yang, Yongying, Zhuo, Yongmo

Journal:

Optik - International Journal for Light and Electron Optics

Year:

2013

Language:

english

File:

PDF, 1.44 MB

english, 2013

13

SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Non-null interferometric system for general aspheric test

Liu, Dong, Zhang, Yudong, Wyant, James C., Yang, Yongying, Tian, Chao, Smythe, Robert A., Wang, Hexin, Wang, Lin, Zhuo, Yongmo

Year:

2008

Language:

english

File:

PDF, 604 KB

english, 2008

14

SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - Study on testing larger asphericity in non-null interferometer

Yang, Yongying, Liu, Dong, Shen, Yibing, Weng, Junmiao, Zhuo, Yongmo, Wang, Yongtian, Tschudi, Theo T., Rolland, Jannick P., Tatsuno, Kimio

Year:

2007

Language:

english

File:

PDF, 795 KB

english, 2007

15

SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - System optimization of radial shearing interferometer for aspheric testing

Liu, Dong, Wang, Yongtian, Tschudi, Theo T., Yang, Yongying, Shen, Yibing, Rolland, Jannick P., Tatsuno, Kimio, Weng, Junmiao, Zhuo, Yongmo

Year:

2007

Language:

english

File:

PDF, 476 KB

english, 2007

16

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Manufacturing and Testing VIII - Non-null interferometric aspheric testing with partial null lens and reverse optimization

Liu, Dong, Burge, James H., Fähnle, Oliver W., Yang, Yongying, Luo, Yongjie, Williamson, Ray, Tian, Chao, Shen, Yibing, Zhuo, Yongmo

Year:

2009

Language:

english

File:

PDF, 427 KB

english, 2009

17

SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Error analysis and system optimization of non-null aspheric testing system

Luo, Yongjie, Yang, Yongying, Liu, Dong, Tian, Chao, Zhuo, Yongmo, Zhang, Yudong, Sasián, José, Xiang, Libin, To, Sandy

Year:

2010

Language:

english

File:

PDF, 595 KB

english, 2010

18

SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Information Optics and Photonics Technologies II - The position shifting of frequency spectrum of Fourier transform in the application of aspheric surface testing

Weng, Junmiao, Mu, Guoguang, Song, Feijun, Yang, Yongying, Liu, Dong, Yu, Francis T. S., Jutamulia, Suganda, Shen, Yibing, Zhuo, Yongmo

Year:

2007

Language:

english

File:

PDF, 1.05 MB

english, 2007

19

SPIE Proceedings [SPIE 23rd Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 22 February 1998)] Metrology, Inspection, and Process Control for Microlithography XII - Scanning force microscope using point diffraction interferometer

Mou, Xu-Dong, You, Yifeng, Zhuo, Yongmo, Yang, Yongying, Xu, Ming, Singh, Bhanwar

Year:

1998

Language:

english

File:

PDF, 242 KB

english, 1998

20

SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study on phase retrieval of a single closed fringe interferogram in radial shearing interferometer for aspheric test

Tian, Chao, Zhang, Yudong, Sasián, José, Yang, Yongying, Luo, Yongjie, Xiang, Libin, To, Sandy, Liu, Dong, Zhuo, Yongmo

Year:

2010

Language:

english

File:

PDF, 1.79 MB

english, 2010

21

SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Optical Design and Testing II - Research of Doppler velocity interferometer system for laser-driven shock wave

Chen, Yangjie, Wang, Yongtian, Weng, Zhicheng, Yang, Yongying, Zhuo, Yongmo, Ye, Shenghua, Sasian, Jose M., Yang, Limin

Year:

2004

Language:

english

File:

PDF, 78 KB

english, 2004

22

SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Optical Design and Testing II - Calculating Strehl ratio through radial shearing method

Lu, Yuanbiao, Wang, Yongtian, Weng, Zhicheng, Yang, Yongying, Chen, Yangjie, Ye, Shenghua, Sasian, Jose M., Zhuo, Yongmo

Year:

2004

Language:

english

File:

PDF, 303 KB

english, 2004

23

High-precision technique for in-situ testing of the PZT scanner based on fringe analysis

Daodang Wang, Yongying Yang, Dong Liu, Yongmo Zhuo

Journal:

Optics Communications

Year:

2010

Language:

english

File:

PDF, 1.12 MB

english, 2010

24

SPIE Proceedings [SPIE 27th International congress on High-Speed Photography and Photonics - Xi'an, China (Sunday 17 September 2006)] 27th International Congress on High-Speed Photography and Photonics - Research of transient flow field real time interferogram acquisition system

Liang, Jiao, Yang, Yongying, Liu, Dong, Zhuo, Yongmo, Hui, Jianhua, Weng, Junmiao, Hou, Xun, Zhao, Wei, Yao, Baoli

Year:

2007

Language:

english

File:

PDF, 245 KB

english, 2007

25

SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Optical Design and Testing II - A radial-shearing interference system of testing laser-pulse wavefront distortion and the original wavefront reconstructing

Yang, Yongying, Lu, Yuanbiao, Chen, Yangjie, Zhuo, Yongmo, Zhang, Xiaoming, Chen, Bo, Qing, Xinwu, Wang, Yongtian, Weng, Zhicheng, Ye, Shenghua, Sasian, Jose M.

Year:

2005

Language:

english

File:

PDF, 209 KB

english, 2005

26

SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Current Developments in Optical Elements and Manufacturing - Common-path interference profiler with nondestructive testing of a supersmooth surface

Yang, Yongying, Zhuo, Yongmo, Cheng, Huashan, Xin, Qiming, Parks, Robert E.

Year:

1998

Language:

english

File:

PDF, 193 KB

english, 1998

27

Misalignment aberrations calibration in testing of high-numerical-aperture spherical surfaces

Wang, Daodang, Yang, Yongying, Chen, Chen, Zhuo, Yongmo

Journal:

Year:

2011

Language:

english

File:

PDF, 1022 KB

english, 2011

28

SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - The wavefront aberration analysis and testing accuracy evaluation for the large aberration aspheric system based on the best fit sphere

Weng, Junmiao, Wang, Yongtian, Tschudi, Theo T., Yang, Yongying, Liu, Dong, Rolland, Jannick P., Tatsuno, Kimio, Shen, Yibing, Zhuo, Yongmo

Year:

2007

Language:

english

File:

PDF, 270 KB

english, 2007

29

Real time diagnosis of transient pulse laser with high repetition by radial shearing interferometer

Liu, Dong, Yang, Yongying, Wang, Lin, Zhuo, Yongmo

Journal:

Year:

2007

Language:

english

File:

PDF, 2.23 MB

english, 2007

30

Microscopic scattering imaging measurement and digital evaluation system of defects for fine optical surface

Dong Liu, Yongying Yang, Lin Wang, Yongmo Zhuo, Chunhua Lu, Liming Yang, Ruijie Li

Journal:

Optics Communications

Year:

2007

Language:

english

File:

PDF, 1.27 MB

english, 2007

31

SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Adaptive Optics and Applications II - Wavefront sensing technique with a radial shearing interferometry applied to an adaptive optic system

Yang, Yongying, Lu, Yuanbiao, Zhuo, Yongmo, Chen, Jian, Zhang, Xiaoming, Chen, Bo, Jiang, Wenhan, Tyson, Robert K.

Year:

2002

Language:

english

File:

PDF, 559 KB

english, 2002

32

SPIE Proceedings [SPIE Applications in Optical Science and Engineering - Boston, MA (Sunday 15 November 1992)] Industrial Applications of Optical Inspection, Metrology, and Sensing - Supersmooth surface profile on-line testing

Tu, Dawei, Zhuo, Yongmo, Lu, Zukang, Brown, Gordon M., Harding, Kevin G., Stahl, H. Philip

Year:

1993

Language:

english

File:

PDF, 390 KB

english, 1993

33

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Manufacturing and Testing VIII - Research of precision interference locating method for a partial null compensator at aspheric testing

Yang, Yongying, Burge, James H., Fähnle, Oliver W., Liu, Dong, Xin, Gao, Williamson, Ray, Tian, Chao, Luo, Yongjie, Shen, Yibing, Zhuo, Yongmo

Year:

2009

Language:

english

File:

PDF, 381 KB

english, 2009

34

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III - Novel double-focus interferometer for scanning force microscope

Zhuo, Yongmo, Mou, Xu-Dong, Yang, Yongying, Cao, Bin, DeBusk, Damon K., Chen, Ray T.

Year:

1996

Language:

english

File:

PDF, 464 KB

english, 1996

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